Used KEITHLEY 4200-SCS #9404531 for sale

KEITHLEY 4200-SCS is an advanced semiconductor characterization system (SCS). It is an integrated, automated test platform designed to accelerate the measurement of advanced semiconductor device properties from start to finish in the shortest time possible. It provides an integrated, user-friendly approach to characterization, verification and device qualification. KEITHLEY 4200 SCS incorporates advanced measurement and analysis tools to ensure accurate and reproducible data that can be quickly obtained with minimal effort. It consists of a control console, master controller/source measure unit, a spectrum analyzer/voltmeter, a pulse generator and an onboard computer. The master controller/source measure unit is designed to measure voltage, current and temperature with better than 1 mV and 1 mA resolution. It can provide 20 mA compliance current and up to 60V compliance voltage. It also allows the user to precisely control, characterize and analyze the electrical characteristics of semiconductor devices and circuits. The pulse generator offers a customized pulse rate with pulse durations from 0.1 μs to 5 ms, and can generate up to 5 MHz square, triangle, and sine waveforms with 0.01% distortion. The spectrum analyzer/voltmeter provides data from 1 Hz to 50 MHz with a high dynamic range and a wide input impedance range. It is available with a number of optional accessories, including switch matrix, low frequency detectors, and semiconductor characterization software. The onboard computer of 4200-SCS includes high-speed data acquisition, data processing/digital signal processing, and charting/plotting software and provides unmatched capabilities for turning collected data into meaningful results. The system also allows the user to define and execute complex test protocols, automating data collection, data analysis and result reporting. 4200 SCS is suited for a wide range of applications, from basic semiconductor characterization to more complex characterization and characterization of submicron devices. It has a superior performance over previous systems, with increased accuracy and repeatability, faster measurement times, and more efficient data handling. Its functions, features and performance make it an excellent choice for laboratories and designers that require an efficient and cost-effective solution for advanced semiconductor characterization.