Used KEITHLEY Yieldmax 450 #9279052 for sale
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ID: 9279052
System
Top chassis:
MCF 9132 With (11) cards
Bottom chassis:
9150 SRU
(3) DMA 9140
(3) CPC 9101
EIM 9102
CGM 9125
MIF 9131.
KEITHLEY Yieldmax 450 is an electronic test equipment designed for monitoring and assessing quality control and yield management in the production of electronic components. It provides an automated, precise, and cost-effective way of evaluating the quality and yield of components in high volume or production automation applications. Yieldmax 450 offers a comprehensive suite of versatile and highly accurate test functions. KEITHLEY Yieldmax 450 offers both TTL and CMOS-level sensitivity with an adjustable frequency range up to 10 kHz. Tests can be performed at multiple points-on-net, between-net parameters, and on multilayer PCB components. Its powerful features also include on-wafer testing capabilities and built-in input protection against short-term electrical surges and static discharge. Yieldmax 450 is equipped with a large LCD display for optimal usability and is capable of testing up to 450 parameters in one pass. System-wide auto-test functions and comprehensive reporting capabilities allow for easy, accurate, and efficient test data assessment. An automated socketless test fixture reduces the need for manual fixture operation and ensures superior test accuracy. It also supports various programming languages and can be integrated with other existing test infrastructure. KEITHLEY Yieldmax 450 can be used in various environments, from the lab to the production floor. It is equipped with the highest standards of repeatability and accuracy. Its high speed testing capability ensures consistently accurate measurements and data processing, while its intuitive user interface allows for fast and efficient operation. In conclusion, Yieldmax 450 is an extremely versatile test equipment that provides precise, robust, and cost-effective test solutions for a variety of production automation and yield-management needs. It boasts a combination of features that are not readily available with other models, such as TTL and CMOS testing, on-wafer testing, automated socketless test fixtures, and comprehensive reporting capabilities.
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