Used KROHN-HITE 3343 #9234666 for sale
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KROHN-HITE 3343 is an electronic test equipment designed for laboratory, industrial, and other applications, including the measurement of dynamic waveforms. This high fidelity instrument offers wide measurement capability and superior resolution of up to 10 µHz at any signal level. 3343 offers users true sine wave oscillator stability and accuracy over a wide frequency range measured in decades. KROHN-HITE 3343's innovative construction features field replaceable sub-assemblies which include the amplifier, oscillator, and display driver. This makes it easy to upgrade to new features or increased functionality with the purchase of an upgrade kit. The modular design further allows the user to customize the unit to their specific needs, with expandable channel-count, vertical range, waveform measurement, and frequency response. The instrument includes a wide range of measurement functions, such as frequency, amplitude, phase shift, and distortion measurements. The high resolution and wide bandwidth of 3343 allows for accurate signal analysis in the frequency domain to track harmonics and other noise. Advanced mathematical functions such as FFT, RMS, filtering, and more, are also supported. KROHN-HITE 3343 further incorporates external control options, such as digital I/O, triggering, remote control, and programmability. It is designed to work in conjunction with other test equipment, making it an ideal choice for integration into automated test systems. The instrument can be connected to the network or workstation for data collection, storage, analysis, or report generation, and can be used with most popular software tools. 3343 is a powerful, reliable tool capable of providing precise and reliable measurements in real-time. It is designed to minimize maintenance and user calibration requirements, while delivering a high performance in the lab and other applications. With its superior resolution and wide measurement capability, KROHN-HITE 3343 promises to meet the requirements of most high-precision test applications.
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