Used LAM RESEARCH 853-085375-015 #9356104 for sale

LAM RESEARCH 853-085375-015
ID: 9356104
RF Generator ENCL TER Filter.
LAM RESEARCH 853-085375-015 is an electronic test equipment module manufactured by LAM RESEARCH Corporation that is used to provide automated testing of semiconductor equipment. The module is designed for in-situ testing and calibration of integrated circuits (ICs) and other electronic components. 853-085375-015 unit provides accurate tests and instrumentation measurements of devices such as capacitors, resistors, transistors, and diodes. It offers easy setup with on-board controls as well as manual and computer-based programming options. The key features of this module include high accuracy and flexibility, allowing it to address diverse applications within the semiconductor industry. It offers a wide range of testing including temperature, voltage, and current measurements. The module also allows data logging and graphing capabilities for problem troubleshooting. LAM RESEARCH 853-085375-015 is constructed using a premium quality printed circuit board (PCB) and includes four chip-scale packages for circuitry and various transistors. It also features four high-impedance coaxial connectors for high-frequency signal connections. The module has integrated thermal protection, which prevents it from overheating and can be used in harsh operating environments. The module is capable of data transmission via various communication protocols such as the popular USB and RS-232 protocols. It also supports Ethernet communication, allowing it to be integrated into complex test systems. 853-085375-015 comes with a plastic carrying case for easy transport and storage. It also has an integrated LED display for easy operation. The module can be easily installed in almost any type of test equipment and is provided with a 3 year warranty to ensure a hassle-free operation. Overall, LAM RESEARCH 853-085375-015 is an advanced test and measurement equipment module designed to deliver accurate instrumentation measurements for various semiconductor applications. Its features and flexibility make it an ideal choice for both lab and production testing environments.
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