Used LECROY WAVE ACE 212 #9081911 for sale
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LECROY WAVE ACE 212 is an advanced dual-channel digital oscilloscope designed for use in a variety of production testing, calibration, and design verification applications. This digital oscilloscope is a reliable and cost effective solution for many of today's test requirements. WAVE ACE 212 features two isolated channels with a bandwidth of 200MHz and a maximum sample rate of 2.5 GS/second. It also offers a sample depth of 2M and an equivalent time mode of 125M. LECROY WAVE ACE 212 is designed to work with any Windows or Macintosh computer, with seamless integration provided by National Instruments LabVIEW or IVI-COM drivers. This allows the user to control and view the oscilloscope's output on a connected PC. A TekVPI probe interface also enables the oscilloscope to be connected to a variety of active and passive probes, further extending its use and functionality. WAVE ACE 212 provides a full set of analysis tools including cursors, triggers, markers, operations math, FFT, ARB waveform library, waveform mask, and analog trend plot. Additionally, LECROY WAVE ACE 212 comes equipped with 7.5-in liquid crystal display (LCD) that offers a bright, easy to use interface and multiple language support, allowing users from all around the world to take advantage of its features. WAVE ACE 212 also comes with a large suite of software capabilities. It includes programs for waveform capture and storage, printing, and remote analysis. It also offers the user an array of built-in analysis and math functions, including FFT, BASIC scripting, and waveform manipulation tools. LECROY WAVE ACE 212 is a highly reliable source for test and measurement, and gives the user a reliable, cost-effective way to perform a variety of tasks. It fits seamlessly into any laboratory or industrial setting, and creates an ideal environment for the occasional user or the full-time technician. With its range of features, advanced interface, and software support, WAVE ACE 212 stands as an invaluable resource for any test and measurement application.
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