Used LITEPOINT IQ2010 #9237352 for sale

LITEPOINT IQ2010
ID: 9237352
Connectivity test system Upgraded to IQ20XX Zigbee UG.
LITEPOINT IQ2010 is a multi-format digital communications test platform that is used to characterize complex wireless devices and their components. IQ2010 has a number of features that set it apart from other test equipment. It has a versatile platform for RF and baseband testing, and its user interface enables rapid setup, test, and analysis. The user can set up and customize tests easily from a single location. LITEPOINT IQ2010 has four main components: a baseband test equipment, RF analyzer, IF test system, and signal generator. The baseband test unit is used to measure data, 2G/3G/4G/LTE/LTE-A/WiFi, and Bluetooth signals. It can measure signal parameters such as EVM, phase noise, modulation accuracy, AGC, and AM/PM. The RF analyzer is a vector network analyzer (VNA) that can measure return loss, insertion loss, and gain. It can also be used to measure precursors/echo/noise and other wireless signal parameters. The IF test machine allows for highly sensitive measurements on frequency selectivity, frequency response, and phase noise. IQ2010 has a signal generator which can generate complex signal patterns available in a variety of formats such as AM, FM, phase modulation, and pulse modulation. The signal generator is capable of generating signals up to 35GHz with up to 120dB magnitude accuracy. It also has an internal switchable pre-selector filter that removes unwanted noise. LITEPOINT IQ2010 has wide dynamic range and low noise floor, allowing for accurate and repeatable measurements. It also has multiple measurement modes, such as mix-mode, two-tone, IF Spectrum, EVM, spectrum occupancy, ACLR, or transmit power. IQ2010 also has Markers, Autopilot, and a wide range of export options. LITEPOINT IQ2010 is highly versatile, making it a great tool for RF design and evaluation. It is highly programmable, allowing the user to custom tailor tests to fit specific needs. IQ2010 is a powerful instrument for modern day wireless device characterization and testing.
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