Used MIE Mi30 #9395534 for sale

MIE Mi30 test equipment equipment is an electronic system for calibration and testing in the laboratory or on the production floor. It is an all-in-one solution for a variety of test parameters. Mi30 unit is designed to be flexible and modular so that it can be configured to fit a variety of testing needs. The instrumentation can be employed to measure voltage, pressure, temperature, current and other parameters. MIE Mi30 mainframe can accommodate up to four instrumentation modules that are installed into a rear-panel slot. A variety of measurement instrumentation modules are available to accommodate different parameters and requirements. The modules can be linked together or used independent from each other using the Multiplexed Input/Output (MIO) Connectivity. MIO allows for elements to be connected across multiple machine modules providing flexibility and scalability as testing requirements change. Mi30 features an intuitive 8-inch touchscreen user interface for easy operation. The menu selections allow for different test parameters to be selected and configured quickly. The tool also has a network remote control interface for customizable remote operation. MIE Mi30 offers built-in safety features to ensure safety during testing of potentially high voltage and current measurements. The asset is equipped hi-potential insulation from the frame and ground, direct over-voltage protection to ensure 100% protection of all test parameters, and instrumentation test limit warning indicators to alert the user of potential danger. The model also offers user defined over-voltage protection setpoints to ensure optimal operator safety. Mi30 data logging function allows data to be acquired and stored for later analysis and reporting. A variety of data logging formats are supported such as .csv, .txt, and .pdf. Data can be exported to various analysis formats allowing for detailed analysis of measurements. MIE Mi30 is designed to be a cost-effective solution for laboratory and production floor testing of a wide range of electronic components. The combination of great flexibility, hi-potential insulation, and numerous I/O options make this a great all-in-one solution for a variety of test applications.