Used MITSUBISHI A1161 #9220991 for sale

MITSUBISHI A1161
ID: 9220991
Wafer Size: 12"
Systems, 12".
MITSUBISHI A1161 is an electronic test equipment designed for logic circuit testing and associated programming operations. This equipment is suitable for users in the area of "embedded system test and evaluation", such as manufacturers of semiconductors, automotive components, LSI, electro-mechanical devices, telecommunication equipment, and more. A1161 offers a variety of features that enable smooth experiment operations for determining the correctness and fault tolerance of device-level logic circuits. The equipment includes 24 output points and 48 input points, which enables direct connection of logic circuity and test points. It also supports dual power supplies, for convenient voltage switching when testing different logic device types. In addition, this equipment provides a logic-level I/C programming solution in order to simplify connection with the device under test. MITSUBISHI A1161 has a built-in RS-232C interface that can accommodate a personal computer and other devices, which enable simple and easy data access and control. This built-in interface can be used to set parameters for various operations, print operation results, and to express measurement data. Also, this equipment features a real-time scan where the logic state of a device-level logic circuits can be sensed and written through a scan chain. A1161 is provided with a dedicated large-bit built-in RAM which is connected to the input/output unit. This large memory capacity makes it possible to easily perform experiment operations with various logic designation codes. This equipment also features a high-speed serial communication function for data transfer and communication between this system and devices connected externally. MITSUBISHI A1161 includes a wide range of functions that are easy to use and that enable flexible operations. These functions include site testing, parallel testing, batch testing, list scanning, investigation of data on the monitoring screen, and more. The user can select the test method from a variety of types, including stimulus/response, driving/sensing at the same time, direct comparing, automatic detecting, loop from logic state, and so on. In conclusion, A1161 is a powerful electronic test equipment designed for logic circuit testing and associated programming operations. This equipment incorporates a wealth of features and capabilities that reduce the amount of time needed for analysis, and help to ensure faithful measurements.
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