Used MKS / ASTEX FI20111 #293660010 for sale

MKS / ASTEX FI20111 is a high performance, frequency interference (FI) test instrument designed to perform fast and effective testing of semiconductor devices under dynamic environmental conditions. This instrument can detect, measure and qualify electrical interference signals over a wide range of frequencies that may affect the performance, reliability and safety of electronic components and systems. It has a frequency range from dc to 225MHz, with an accuracy of 0.1%. The sample rate is up to 500 MS/s and is equipped with an amplifier gain of 1 - 100dB. It has a display resolution of up to 1 mV. The instrument is also equipped with two two- and three-axis field strength meter probes and a digital isolator adapter for connecting specialty probes. The instrument's Frequency Interference (FI) capabilities make it ideal for validating susceptibility and immunity levels in a variety of applications, such as communications and navigation, automotive, industrial and medical applications. MKS FI20111 utilizes a 9-step test routine that includes test items ranging from simple frequency sweeps up to more advanced analysis and filtering. The instrument can also provide valuable information about noise ource characterization, immunity levels, and signal power level using the built-in spectrum analyzer and network analyzer capabilities. For instrument or equipment testing, ASTEX FI20111 has a user-friendly GUI system which can perform tests on RF elements faster. This GUI interface also supports remote control through Ethernet or USB port. The instrument can be connected in parallel with other FI instruments in the same environment, for enhanced debugging capabilities and fractional or high throughput frequency interference testing. The instrument is also equipped with advanced diagnostics capabilities which can identify nonlinear responses or unit asymmetries quickly and accurately. Further, it includes built-in power estimation functions which give a detailed analysis of frequencies and voltage amplitude for each test result generated. FI20111 is a cost-effective, high-performance frequency interference and immunity testing instrument ideal for a range of measurements in the research, development and production of semiconductor devices and systems. It has comprehensive diagnostics and analytical features which enable faster results and greater accuracy testing, and its user-friendly graphical interface offers a comprehensive view of the machine's performance.