Used MULTILANE ML 4054-400 Gen 2 #293640895 for sale

MULTILANE ML 4054-400 Gen 2
ID: 293640895
Testers.
MULTILANE ML 4054-400 Gen 2 is an electronic test equipment (ATE) developed by MULTILANE. This ATE functions as an out of the box solution for characterizing high speed digital devices and integrated circuits (ICs). The instrument offers an unprecedented level of configuration capability, enabling operators to quickly and easily define serial interface and data protocols. With this capability, users can streamline their testing processes and reduce development costs. ML 4054-400 Gen 2 ATE supports high speed digital and mixed signal interfaces, such as LVDS, CML, PCIe, and HDMI, among others. It has an advanced signal quality performance, allowing for comprehensive testing of high speed signals at up to 16 Gbps. The equipment also provides a comprehensive test environment, allowing users to execute automated device characterization and system-level simulations. Additionally, the ATE is designed to meet the stringent requirements of today's high speed applications, with full protection against ESD, power glitches, and other common threats. MULTILANE ML 4054-400 Gen 2 ATE is highly programmable, making it suitable for hardware designers and IC designers who need to configure the unit to match their device under test (DUT). The instrument is capable of controlling differential drive levels and high speed signals, allowing for maximum flexibility when setting test parameters. A broad range of scripting and scripting functions enable users to quickly and easily program the machine to ensure reliable results. Additionally, the ATE features various flexible triggering, synchronization, and control features which help automate tests. ML 4054-400 Gen 2 ATE includes multiple graphical user interfaces (GUI), enabling it to be quickly and easily setup and configured. It also features an embedded design language that enables the instrument to be used as an automated test tool (ATS). The instrument is coupled with the proprietary MULTILANE Pattern Generator (MPG), which simplifies the process of pattern execution. Additionally, the ATE supports low-level embedded firmware operation, allowing the instrument to control multiple I/O pins efficiently. MULTILANE ML 4054-400 Gen 2 ATE also has a built-in simulation engine and performance metrics asset, allowing users to determine if their device meets product specifications. The simulator helps users visualize their results and provides them with insight on how their design is performing. It also supports data analysis tools which help users more thoroughly troubleshoot their designs. ML 4054-400 Gen 2 ATE is an all-in-one solution for electronic testing and characterization. Its advanced features, flexibility, and programmability make it an indispensable tool for high speed design and characterization.
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