Used ROHDE & SCHWARZ NAP-Z4 #9270150 for sale

ROHDE & SCHWARZ NAP-Z4
ID: 9270150
RF Power / Reflection meter Frequency: 25 MHz~1 GHz 846 - 54/012.
ROHDE & SCHWARZ NAP-Z4 is an electronic test equipment that enables the measurement of high frequency signals up to 4 GHz. It is designed and manufactured by ROHDE & SCHWARZ, and provides users with the highest accuracy and repeatability in their measurement results. NAP-Z4 is a 2-port vector network analyzer, and can be used to measure both amplitude and phase of electromagnetic waves over a wide frequency range. It has a user-friendly graphical user interface, making it easy to learn and use. Additionally, ROHDE & SCHWARZ NAP-Z4 has several features designed to ensure accurate results. These include a Noise Separation Mode, which separates noise components from the signal, and Predefine Mode, which allows users to define test limits for the measurements. NAP-Z4 also features an adjustable range of converters, including a minimum reference frequency range of 16 kHz to 4.4 GHz. This allows the user to select the required frequency range for their tests, in order to eliminate any unnecessary loss of signal power that could arise from the use of an incorrect frequency. Other features include high test signal sensitivity and excellent dynamic response. ROHDE & SCHWARZ NAP-Z4 has a full set of RF metrology ports, allowing the connection of external cabling and connectors for consistent electrical measurements. It also features an easy to navigate measurement timeline, allowing users to quickly access their most recent measurements for review and analysis. NAP-Z4 also comes with a variety of application modes for different band-limited tests, frequency sweeping, and scanning tests. Additionally, ROHDE & SCHWARZ NAP-Z4 supports a variety of industry standards, such as Ethernet, Bluetooth, Wi-Fi, Zigbee and Z-Wave. NAP-Z4 is the perfect tool for any engineer or technician looking for accurate, repeatable measurements. It is easy to use and set up, and provides excellent signal sensitivity and dynamic performance for any tests it is used for.
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