Used ROHDE & SCHWARZ SFL-S #9092506 for sale
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ROHDE & SCHWARZ SFL-S is a universal RF test device from ROHDE & SCHWARZ that is widely used for various RF and microwave measurements in the frequency range of 9kHz to 3GHz. It provides reliable solutions in various fields such as research, production, automotive and telecommunications. SFL-S is mainly used for characterizing and developing components, modules, antenna systems, radio communication devices and networks. It is ideal for testing RF and microwave components and systems. It is equipped with a high-resolution LCD display that ensures accurate and intuitive operation. ROHDE & SCHWARZ SFL-S has a wide range of measurements and features to offer. It includes built-in signal generators, spectrum analyzers and network analyzers. It also offers power measurement, data logging, frequency domain measurements and multiple channel measurements. It is also suitable for multiple signal generator tests. It also provides measurement documents, macros and application programming interfaces for automated measurements. One of the major features of SFL-S is its high input power levels up to 30 dBm, which provides improved resolution in the RF measurements. It offers several factory extensions that allow the user to customize the system according to their measurement requirements. The input sensitivity allows users to perform highly precise power measurements in the presence of weak signals. The integrated interpolated frequency counting unit (IFU) includes time-domain analysis, averaging and gating functions that enable clear representation of the measured signals. ROHDE & SCHWARZ SFL-S is easy to operate with its clear user interface. The intuitive control concept enables users to quickly configure the system and to run sophisticated measurements with confidence. Additionally, it includes automated functions that allow users to perform measurements efficiently and with precision. Overall, SFL-S is an ideal tool for both basic and sophisticated RF test solutions. With its wide range of measurements and features, it can help users reduce testing time and costs.
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