Used ROHDE & SCHWARZ ZNB20 #9265064 for sale
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ROHDE & SCHWARZ ZNB20 is a high-performance network analyzer designed for vector network measurements. It offers wide-band coverage, high measurement speed and a range of special features for both engineering and manufacturing test applications. ZNB20 has a frequency range from 9 kHz to 8.5 GHz, and is capable of fast and accurate S-parameter measurements. Its built-in vector signal analyzer provides time domain waveforms with 20 MHz resolution bandwidth. ROHDE & SCHWARZ ZNB20 also offers very low noise figures, high resolution, high signal purity and exceptional pulse characteristics. ZNB20 is a powerful tool for research and development, production and QA activities. In addition to S-parameter measurements, the instrument can provide other specialized measurements such as gain compression, gain flatness, insertion loss, radiation patterns, isolation, through loss, and IP2/IP3 parameters. ROHDE & SCHWARZ ZNB20 has a rich input/output port architecture, allowing users to integrate measurements directly into their test systems. It also includes several intuitive display modes which can be used to view the measurement data in a variety of graphical and tabular ways. ZNB20 includes a wide range of software tools to facilitate data analysis, such as ROHDE & SCHWARZ STARGATE toolbox, which provides advanced post-processing capabilities for both time and frequency domain analysis. ROHDE & SCHWARZ ZNB20 is designed with a robust and reliable hardware architecture in a compact package. It is also built with modern components that allow for better isolation and improved calibration stability and significantly reduce the setup time. The instrument is designed to be operated as an integrated part of test systems, providing accurate and repeatable performance. ZNB20 is an essential tool for users looking to obtain high-precision network measurements with high speed and accuracy. It offers a wide range of features and capabilities, allowing users to efficiently troubleshoot circuitry and optimize component performance in any test environment.
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