Used ROHDE & SCHWARZ ZVA24 #9308821 for sale

ROHDE & SCHWARZ ZVA 24 is an electronic test and measurement instrument designed for development and production testing of passive components such as inductors, capacitors, and resistors. The instrument features two built-in RF inputs and four independent RF measurement channels allowing simultaneous testing of up to four devices. It offers a wide frequency range of up to 110 GHz, a high dynamic range of 90 dB, and a high sensitivity across the entire frequency range. The device is capable of measuring both real and imaginary components of the S-parameters of a device. These parameters measure the reflection and transmission coefficients of the device under test, and can be used to determine the frequency response of the device and its electrical performance. It has a built-in calibration routine, providing reliable and accurate measurements. The built-in calibration routines can be set according to the desired method; there are two options to choose from - single frequency and trace. ROHDE & SCHWARZ ZVA24 also has a DUT biasing feature, which can be used to apply a signal to the device under test before taking measurements. This feature is useful when measuring active components such as transistors. The device is equipped with a large 5.7-inch color TFT display, allowing users to easily navigate menus, view instrument settings, waveforms, and measurement results. It also features a built-in floppy drive for easy data storage. ZVA24 is equipped with a GPIB (IEEE-488) standard interface, enabling communication with desktop applications, test automation, and computer-controlled measurements. It also supports LAN, USB, and RS-232 interfaces, offering a wide connection range. ROHDE & SCHWARZ ZVA24 is an advanced, versatile tool providing accurate S-Parameter measurements in a wide range of frequencies. It combines the features of an RF source, a highly accurate vector analyzer, and a DUT (Device Under Test) interface, allowing for precise measurement of both real and imaginary parts of S-parameters. It is an ideal instrument for development and production testing of extremely wide range of passive devices.