Used SCIENTECH RVX 5000 XPS #9315829 for sale

SCIENTECH RVX 5000 XPS is an advanced electronic test and measurement equipment for the analysis of surface and near-surface physical and chemical properties of surfaces. It is a combination of several pieces of advanced test equipment designed to provide extensive data on a range of materials. The main component of the system is the X-ray Photoelectron Spectroscopy (XPS) instrument, which can measure the elemental composition of surfaces in great detail. XPS requires a powerful x-ray source, and RVX 5000 XPS is designed to use high-powered microscopes to focus the x-ray beams onto the sample and detect the emitted photoelectrons, resulting in a rich dataset of elemental composition. This enables the user to accurately and precisely measure the chemical composition of the sample surface. In addition to XPS, SCIENTECH RVX 5000 XPS includes surface analysis modules such as Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). AFM and SPM are high resolution imaging techniques used to examine the surface structure of samples, such as imaging surface topography and measuring such properties as surface roughness. They can also be used to measure force-distance curves or measure electrical properties of conducting samples. RVX 5000 XPS also includes Time of Flight Secondary Ion Mass Spectrometry (TOFSIMS) for the analysis of surface anions and molecules. TOFSIMS works by bombarding a sample with high-energy particles (ions) which are then detected by an array of detectors. SCIENTECH RVX 5000 XPS unit is designed to analyze the mass of the ions detected, thus allowing for the analysis of both positive and negative ions. Finally, RVX 5000 XPS is equipped with a Raman spectroscopy module, providing valuable information about surface vibrational properties. Raman spectroscopy works by exciting a sample with a laser and analyzing the scattered light, which can then be spectrally analyzed to reveal the vibrational characteristic of the surface. SCIENTECH RVX 5000 XPS is an advanced test and measurement machine, combining multiple tools to enable the user to analyze the surface and near-surface properties or various materials. It employs X-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM), Time of Flight Secondary Ion Mass Spectrometry (TOFSIMS) and Raman Spectroscopy to provide remarkable data on the elemental composition, topographic measurements, force-distance curves, vibrational properties and more of a vast range of materials.