Used STANFORD RESEARCH SYSTEMS / SRS SR620 #9165619 for sale

STANFORD RESEARCH SYSTEMS / SRS SR620 is an electronic test equipment designed to cover a wide range of frequency and amplitude measurements. It utilizes a high performance analog signal processor to acquire, demodulate and analyze signals in the frequency domain or time domain. The measurement capabilities of SRS SR620 include the monitoring of amplitude, frequency, and phase of a signal as well as the ability to characterize frequency-dependent noise and distortion phenomena. STANFORD RESEARCH SYSTEMS SR620 has two dual-channel frequency-analyzers that measure a variety of parameters, including phase response, group delay, third-order intermodulation distortion, and phase noise. The channel overlap feature allows for concurrent operation of both inputs while processing them as individual channels. This enables users to measure multiple phenomena simultaneously such as phase noise and group delay performance. SR620 is extremely accurate, with its phase and delay measurement operating within 0.04 degrees. Additionally, its measurement bandwidth extends from 10 to 26.5 GHz with an optional 10 to 40 GHz footprint. STANFORD RESEARCH SYSTEMS / SRS SR620 also features a high dynamic range, with phase noise measurement capability up to -160 dBc/Hz and magnitude noise measurement up to -150 dBm. SRS SR620 uses a single-channel modulated signal generator for creating waveform analog and digital signals, providing one of the cleanest and most repeatable signal sources available. This signal generator has a frequency stability of 0.01 parts-per-million, supporting a wide range of applications such as down-converter linearity measurements and intermodulation distortion analysis. The other vital features of STANFORD RESEARCH SYSTEMS SR620 include a wide variety of noise figure parameters, including the related gain, source Match, and isolation components that are of particular use to signal analyzer measurements. High update rates and fast sweeps provide easy and accurate spectrum analysis of small, dynamic signals. Additionally, the multiple display modes such as the contour or waterfall mode help users make quick and easy comparisons between different measurements. SR620 also includes advanced automated vector measurements that can be configured to sweep a wide range of signal parameters. This feature allows for quick and accurate reprocedures of passive and active RF/microwave components. The automated vector measurements deliver quick and detailed information with no manual intervention needed, making it an incredibly efficient and highly valuable tool. Overall, STANFORD RESEARCH SYSTEMS / SRS SR620 is an incredibly powerful and reliable test equipment that is able to provide precise measurements of a wide variety of signal parameters over a broad frequency range. Its versatility allows it to be used in a broad range of applications, making it an invaluable part of any laboratory.