Used SUN Netra 1280 #173440 for sale
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ID: 173440
Server with rack
Includes:
(1) 541-1505-02
(2) 540-6826-01
(1) IB.SSC
(1) 541-0176-06
(2) 540-6804-01
(2) SUN 17g 10K HARD DRIVES
(3) POWER SUPPLIES 3001-883-01
CABLES.
SUN Netra 1280 is an electronic test equipment designed and developed by Oracle, which was formerly known as SUN Microsystems. Netra 1280 is an advanced equipment module (ASM) test system specifically designed to perform tests on computer unit memory. SUN Netra 1280 utilizes two Intel Xeon E5-2660 processors, each running at a clock frequency of 2.2 GHz, with four DDR3-1600MHz DRAM banks and eight 10-Gigabit Ethernet ports. The test machine provides a high performance solution for memory testing needs. Netra 1280 supports a wide range of tests including patterned memory addresses, memory read/write operations, and data integrity verification tests. It also supports various protocols, including LAN traffic, IP traffic, and UDP traffic. Additionally, the tool has the capability to read from and write to Flash memory chips. SUN Netra 1280 utilizes a modular architecture, allowing for various confi-gurations and standards, such as 1.2GHz and 2.4GHz CPUs, ECC DRAM, x16 and x32 DDR, 1GB and 2GB DRAM banks and more. The asset also has an onboard XMC/VPX Processor, making it ideal for embedded applications. In addition, the kit comes complete with all the requisite test tools such as a pattern generator, scope, calibrator, oscilloscope and more. The kit also provides the necessary cables, connectors and adapters to ensure easy set up and testing. The model is also software configurable, allowing for customizations and settings to meet specific testing requirements. Netra 1280 has been specifically designed to meet mission critical memory testing needs. It is a reliable, low power, and highly scalable equipment which meets various testing needs. The system is well suited for complex testing scenarios and for providing fast response in mission-critical applications. SUN Netra 1280 is an ideal choice for high performance memory testing requirements.
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