Used TEKTRONIX 11801 #9247225 for sale

TEKTRONIX 11801
ID: 9247225
Oscilloscope.
TEKTRONIX 11801 is an advanced electronic test instrument designed for high-resolution capability and enhanced accuracy. It is used to test a range of complex devices, such as memory chips or high-drain devices. The device features a Digital Sampling System, DSS technology, which allows extremely accurate measurements of electrical signals. Its Pulse-Width Modulation (PWM) capability ensures accurate pulse-width measurements. The instrument offers four channel input capability with a maximum resolution of 10 mV up to 300V. 11801 also provides user-selectable Pre-Trigger Delay (PTD) that enables accurate sampling of wave forms affected by the pre-trigger delay. The Delay Magnification (DM) feature allows higher resolution of waveforms for diagnostics or measurement of out-of-band frequencies. TEKTRONIX 11801 supports a variety of waveform measurement and analysis functions, including Cross-Channel, Multi-Channel, and Waveform Comparison. The device features an 8-bit Digital Signal Processor (DSP) for real-time waveform sample rate adjustment. It also supports multiple modes such as Normal, Single-Shot, and Multiplexing and has a sample clock frequency range of 100MHz. 11801 provides a Comprehensive Response Measurement (CRM) capability that enables measurements on pulse-width modulation (PWM), current pulse, and fast-pulse signals. The instrument also allows for waveform averaging as well as maximum peak, minimum peak, and peak-to-peak measurements. Additionally, the instrument has variable gain variable bandwidth filters to remove high-frequency noise for enhanced accuracy. The instrument provides reliable and consistent results thanks to its low equivalent time constants and remarkably low phase jitter. It is protected from short-circuits and RF noise by built-in opto-couplers. Furthermore, TEKTRONIX 11801 features an intuitive user interface with a large color display for ease of use. 11801 is an advanced and versatile electronic test instrument that offers excellent resolution and advanced features for analyzing complex electronics. It delivers reliable and accurate results thanks to its digital sampling system, pre-trigger delay, and comprehensive response measurement capabilities. The instrument offers superior dynamic performance thanks to its low equivalent time constants and low phase jitter. Additionally, it features a user-friendly interface and protection from short-circuits and RF noise.
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