Used TEKTRONIX 370A #149030 for sale

TEKTRONIX 370A was a benchtop electronic test equipment manufactured by TEKTRONIX that was released in 1965. TEKTRONIX 370 A was a dual-trace analog oscilloscope with a 2-channel input and a 20MHz bandwidth. It was capable of up to 350 Volts peak-to-peak input on its A and B channels, 20mV-10V/div sensitivity, X-Y mode operation and 0.1% linearity. It had a triggered sweep of 6kHz-1Hz/div, hold-off range up to 400 µs, calibrated galvanometric variances of ±1000:1, deflection voltage of up to100 Volts, and a maximum vertical display range of 18 divisions. 370A also included a low-frequency response filter, a built-in 5 MHz-bandwidth diode-triode amplifier, and up to 1 KHz A and B sweep rates. 370 A was powered by an AC power supply and used a low-tension cathode-ray tube (CRT). The instrument took in two separate input channels, A and B, which could be monitored simultaneously in either automatic or triggered modes. The trigger source could be either internal or external, and a universal clamp was also installed as standard. TEKTRONIX 370A also featured a high-frequency sweep at B with a high sensitivity and selectable deflection. This provided precise measurements of relatively low-amplitude signals, such as those typically encountered with semiconductors and other circuit components. TEKTRONIX 370 A also utilized a dynamic-focus control, providing precise dynamic-focus adjustments to ensure that the beam was always in precise focus for high-accuracy measurements. Additionally, the instrument was equipped with an intensity-control knob, helping users to adjust the brightness of the display. Furthermore, 370A was equipped with calibration and linearity controls to enable precise level settings allowing easy switch-over between manual and automatic modes. Overall, 370 A was a reliable and accurate instrument, providing versatile and precise test capabilities for analog signals. Its powerful features allowed precision signal analysis, making it an ideal choice for electronic test and troubleshooting, circuit analysis, signal identification, and other important test operations.