Used TEKTRONIX DPO 4104 #9354378 for sale

TEKTRONIX DPO 4104 is an advanced digital real-time oscilloscope from TEKTRONIX. It provides breakthrough performance in bandwidth and signal acquisition rate for faster, more accurate characterization of emerging digital designs. DPO 4104 has an engaging graphical user interface (GUI) that allows the user to easily manipulate the device and get the most from it. With its advanced estimation and math capabilities, it can help you quickly diagnose problems in your design. TEKTRONIX DPO 4104 features a 10.1-inch touchscreen and display that provides a visually appealing interface for the user. It also has a spectrum analyzer, arbitrary waveform generator, and a linear and switching power supply capability. It uses an 8-bit Phosphor technology that samples even small signals and provides detailed results for characterization. Its 10-GHz bandwidth allows for the capture of even the fastest real-time signals and makes DPO 4104 an invaluable tool for troubleshooting, characterization, and testing of digital designs. The large 8k deep memory allows you to capture large blocks of data and review any past situations. It supports a wide range of analog and digital probes, which allows the user to explore more applications beyond just digital designs. With the built-in Ethernet and USB interfaces, you can easily integrate TEKTRONIX DPO 4104 with a workshop computer to analyze complex data. To further improve its functionality, DPO 4104 is powered by ScopeCORE™ , the latest version of TEKTRONIX Advanced Measurement Technology. This technology streamlines complex measurements by providing automated operation and results in a timely manner. Overall, TEKTRONIX DPO 4104 allows engineers to accurately measure analog and digital signals to investigate anomalies or create innovative solutions. It has modular hardware and software capabilities that make it flexible for all types of applications. Furthermore, its low-noise performance and expanded memory make it a go-to solution for challenging measurement environments.