Used TEKTRONIX P6133 #9264343 for sale

TEKTRONIX P6133 is an electronic test equipment designed for probing high-speed, high frequency signals on devices with embedded memory systems. It is a high-performance test probe that provides maximum signal fidelity and minimal voltage transient. It features a special low-deflection tip designed to reduce overshoot and undershoot resulting from high-speed transitions. P6133 has an innovative design that allows the tip to be snapped into place quickly and easily, making it quick and easy to use in a variety of testing scenarios. The probe's low-deflection tip is designed to reduce voltage swings resulting from high-frequency transitions. Its high frequency performance is further enhanced by its capacitance of 0.5 pF. High frequency response of the probe is also enhanced by its low capacitive loading of 0.5 pF. This low loading allows for equipment to be tested without incurring speed penalty associated with high capacitive loading. TEKTRONIX P6133 probe comes with an extended frequency range of up to 30 GHz and high signal fidelity. It also features a low profile, making it ideal for space-constrained testing environments, and a wide dynamic range of 0 to 500 V. This makes it suitable for testing various devices such as DRAMS, SRAMs, and Flash memory. Its low capacitance helps to ensure highest signal integrity and minimal crosstalk. P6133 probe also features a unique spring overshooting technology which is designed to reduce ringing noise and overshoot during high-speed testing. This provides a stable signal during testing, ensuring accuracy and reproducibility. It also features a self-calibrating technology which ensures correct probe compensation during testing. TEKTRONIX P6133 can be used both in benchtop and portable test applications. Its carry case is designed to withstand frequent handling, making it highly durable in a variety of testing scenarios. P6133 also comes with a silicon dust cover to protect it against debris and other environmental factors. Overall, TEKTRONIX P6133 is a highly versatile test probe that is ideal for probing high-speed, high frequency signals on embedded memory systems. It offers high performance, fast setup, and minimal capacitance loading. Its low-deflection tip provides a high frequency response that enables accurate testing without incurring speed penalty. Its self-calibrating technology further improves accuracy. It is ideal for a variety of portable and benchtop testing applications.