Used TEKTRONIX P6201 #9227988 for sale

TEKTRONIX P6201 is a high-performance differential amplifier probe designed as an electronic test equipment, providing an ideal solution for high-voltage and high-current applications. Featuring a 30 MHz bandwidth with up to ±1500V differential input range and a bandwidth of 14 MHz with up to ±400mA current range, this differential amplifier probe makes it easy to measure and monitor electronic signals. With its+/- 2% accuracy across its 400 mV to 1.8 V input range, the probe is especially well-suited for use with high-powered electronics, such as those found in motor control systems, automotive electronics, and in instrumentation applications. P6201 includes high-performance signal conditioning capabilities, allowing it to accurately measure high-frequency and low-level signals up to 20 MHz. This makes it suitable for applications such as RF circuit analysis, telecommunications, and signal integrity testing. The probe features high rejection of up to 40 dB common mode rejection ratio (CMRR) and noise levels down to 8 uV, making it ideal for measuring low-frequency noise signals. The probe also includes support for the TekProbe interface, providing the ability to connect directly to TEKTRONIX oscilloscopes and data loggers. This reduces the need for cabling and signal conditioning circuit boards, making it easier to set up and take measurements in a variety of applications. The probe's miniature build makes it ideal for use in portable or benchtop environments, as well as for use in automated processes. Its durable construction and sturdy design also make it suitable for use in rugged environments, and the adjustable protection shell can be used to protect sensitive electronics during extreme conditions. Overall, TEKTRONIX P6201 is an ideal electronic test equipment for a wide range of applications, providing users with accurate measurements in challenging environments. With its high accuracy, widebandwidth, and TekProbe compatibility, it's sure to satisfy the needs of any electronic-test applications.