Used TEKTRONIX TDS 2002B #293807570 for sale

TEKTRONIX TDS 2002B is an electronic test equipment designed for digital and mixed signal oscilloscopes. It is used to measure and analyze signals and waveforms for research, development, and verification purposes. It is capable of displaying up to six channels of real-time graphics and timing measurements. TDS 2002B has a 500 MHz bandwidth and sample rate up to 2GS/s. It features two deep memory banks of up to 10 megapoints record length for each channel. TEKTRONIX TDS 2002B also provides selectable trigger types including edge, slope, pulse width, video, and logic to operate on the selected channel. TDS 2002B includes a built-in 1GHz Dynamic Digital Delay to allow operators to adjust the delay from trigger point. This feature allows users to examine the exact signal they're looking for. It also has a 12-bit vertical resolution to capture sharp details in its displayed signal. In addition, TEKTRONIX TDS 2002B includes a comprehensive collection of built-in function generators, providing users with fourteen distinct waveforms, including sine, ramp, triangle and pulse width modulated and their various derivatives. Built-in measurement modes include frequency, period, voltage, current, and duty cycle. TDS 2002B is powered by a standard + 5V to +15V power supply, and includes a USB connection for maximum flexibility in a variety of environments. TEKTRONIX TDS 2002B has an intuitive display with a vivid 24-bit color palette, allowing you to plot complex signals with ease. The display also enables users to make more accurate measurements by zooming and panning into areas of interest. Its easy-to-use touchscreen operations make navigating the various features of TDS 2002B easy and efficient. Overall, TEKTRONIX TDS 2002B is a powerful, user-friendly and reliable oscilloscope. Its comprehensive suite of features and performance make it well suited for a variety of tasks and environments. TDS 2002B is ideally suited for professionals in electronic signal, spectrum, and timing measurements and analysis.