Used TEKTRONIX TDS 3054B #9187329 for sale

TEKTRONIX TDS 3054B is an electronic test equipment made by TEKTRONIX for testing, troubleshooting, and debugging digital and analog circuits. It is designed to help engineers, researchers, and programmers quickly identify issues and resolve them quickly. As a multi-function test instrument, TDS 3054B provides an array of features that include sampling, signal capture, triggering, and waveform analysis. TEKTRONIX TDS 3054B's bandwidth is up to 500 MHz, and has a 4 GS/s simultaneous sampling rate for capturing high-speed signals. With its unique deep memory capability, it can hold up to 2 M of memory, producing an accurate and detailed view of complex waveforms. This allows for greater insight into signal character, and includes segmented memory readouts to accurately compare more than one time segment from a single acquisition. For triggering, this test equipment includes advanced capabilities such as limited waveforms, digital combination, advanced timers, and more. There are also a full suite of automatic measurements and analysis functions such as powerful signal search, amplitude, frequency, rise/fall times, and more. This ensures that engineers can easily find worst-case scenarios, or quickly diagnose suspected circuit issues. In terms of digital testing, TDS 3054B has an integrated logic analyzer for 64 digital channels, with 8 logic level states, and a high-speed RateMonitor section that is ideal for JTAG, I2C and automation protocols. This is combined with a TLA viewer, which lets engineers examine complex signals without having to interpret the data themselves. The TLA viewer includes complex displays such as bus expansion views, process flow diagrams, as well as advanced searching and filtering. Overall, TEKTRONIX TDS 3054B is a solid multi-function electronic test instrument, meant for troubleshooting and debugging digital and analog circuits. With its range of triggering and signal capturing capabilities, it provides users with an accurate and detailed view of complex waveforms. Its high-speed memory means that engineers can easily identify more than one time segment from a single acquisition. And with its advanced digital testing capabilities, it can easily spot even the most complicated problems.