Used TEKTRONIX TDS 520A #9025828 for sale

TEKTRONIX TDS 520A is a two-channel, 500MHz digital oscilloscope with built-in dual-channel FFT capability. It provides an excellent combination of speed, real-time performance, and features to meet most any digital oscilloscope needs. It offers two analog channels and 16 digital inputs/outputs (15 digital X/Y plus a reference input). TDS 520A has an 8" TFT color LCD display, providing a choice of multiple triggering modes including pulse width, edge, slope sign and timeout. The built-in FFT feature allows users to analyze frequency response and perform harmonic and Fourier analysis of an input signal. It also offers numerous signal conditioning and measurement functions, including Autoset, normal mode, and multiple single-shot acquisitions for capturing transient and noise signals. TEKTRONIX TDS 520A is a precision instrument, designed to meet the needs of precision digital signal measurements, and digital waveform display and analysis. It features a high resolution sample rate of up to 1 GS/sec, with 16 bit vertical resolution. TDS 520A has a comprehensive set of advanced triggering modes and signal conditioning to help with complex waveform analysis. It also offers automated setup and measurement functions, and spectrum display. Other standard features include advanced waveform math, waveform display and store, and a standard FFT capability up to 1 GHz. TEKTRONIX TDS 520A also features an advanced application environment allowing for the customisation of the instrument settings and operation parameters. It also offers SCPI commands for external control. This instrument is protected from line transients by an advanced EMI filter and comes with an isolation transformer, protected against lightning strikes. It is also RoHS and WEEE compliant for global compliance. TDS 520A is a perfect oscilloscope for general-purpose applications like waveform tracing, transient analysis, measure frequency components, impedance analysis, signal distortion, harmonic distortion, crosstalk analysis, and complex signal measurements. It can also be used in high-speed circuit and logic analysis, digital system or microprocessor testing, semiconductor device characterization, and automated test and production applications.