Used TEKTRONIX TDS 6154C #9192200 for sale
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TEKTRONIX TDS 6154C is a state-of-the-art digital oscilloscope used for electronic measurement functions and manufacturing testing. This 4-channel oscilloscope provides comprehensive debugging and analysis capability for embedded and analog designs. With its intuitive user interface and advanced triggering and triggering functions, this scope can effectively capture and characterize waveforms in both design and test scenarios. The unit is capable of capturing signals up to 150 MHz bandwidth with 500MHz, 1 GHz, and 1.5 GHz maximum sample rate options. Four fully independent channels provide 16-bit resolution and 500V/500MHz input range. Real-time sample rates of up to 200MS/second provide reliable, accurate capture and analysis of transient events. This scope also features an extensive range of measurements, including edge, pulse width, rise/fall time and setup/hold. TDS 6154C oscilloscope also includes several other advanced features. These include an XGA active matrix LCD display, waveform recording and replay capabilities, an FFT display, and triggered operation. This oscilloscope also features an autoscale function which automatically adjusts the gain and range to ensure proper waveform capture. There are a range of trigger types available, including edge, slope, pulse width, setup and hold, overtemperature, and voltage. Connectivity is also an important feature of TEKTRONIX TDS 6154C. It provides multiple ports, including LAN, USB, GPIB, and VGA inputs. Additionally, a range of digital signal input formats can be handled, including single and mixed-signal formats. This helps to ensure that the unit can easily connect and communicate with other test equipment. Overall, TDS 6154C is an excellent choice for testing and debugging digital components, measuring analog signals, and analyzing complex waveforms. With its intuitive user interface, extensive range of features, and compatibility with a range of test equipment, this oscilloscope is a great choice for any electronic measurement application.
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