Used TEKTRONIX TDS 754C #121347 for sale

TEKTRONIX TDS 754C is a high performance digital oscilloscope designed to meet the most demanding applications. It features 4 or 8 analog channels, a sample rate of up to 200 MHz, and a maximum memory depth of 2Mpoint/channel. TDS 754C also has optical isolated USB communication interface to allow remote control. TEKTRONIX TDS 754C is designed with a color LCD touchscreen display, providing an intuitive and easy-to-use interface for operation. The display has a high resolution of 800x480 and a bright backlight for excellent visibility in any lighting condition. Additionally, TDS 754C has an integrated menu system for quickly navigating between measurements, settings, and data review. TEKTRONIX TDS 754C's high sample rate, up to 200 MHz, maximizes accuracy and eliminates aliasing. Additionally, its low-noise performance guarantees ultra-low distortion in measurements as well as high dynamic range. TDS 754C also features TEK-SCOPE Express™ software for triggering, recording, and viewing live and stored waveforms. TEKTRONIX TDS 754C also offers a variety of advanced measurement tools to increase productivity and performance. The Auto Measurements feature records up to 64 measurements, and can capture multiple measurements from a single waveform. The Waveform Math feature acts as a powerful spectrum analysis tool, allowing for manipulation of multiple waveforms. Additionally, the Pulse Measurement feature lets users trigger on pulse widths, and the Frequency Count feature displays frequency, period, and other measurements. TDS 754C has a variety of I/O ports for a variety of applications. These include a USB 2.0 port, LAN port, and GPIB port. Additionally, TEKTRONIX TDS 754C is designed with a variety of triggering options, including Edge, Pulse Width, Pattern, or Serial triggering. Overall, TDS 754C is a highly advanced digital oscilloscope designed to handle the most complex testing applications. It features a high sample rate, advanced triggering options, and an intuitive interface to maximize productivity during testing. Furthermore, its variety of I/O ports, measurement features, and advanced math capabilities offer the versatility and accuracy needed in today's testing environments.