Used TEKTRONIX TDS3052 #9229079 for sale

TEKTRONIX TDS3052 is an advanced electronic test equipment designed to assist in the testing and troubleshooting of digital and analog circuits. It offers both timing and frequency measurements as well as analysis capabilities. It is also designed to work with TEKTRONIX logic timing and spectrum analyzers, as well as other electronic measurement applications. TDS3052 is a 4-channel, color digital scope which enables easy identification of signal and measurement information. It has a maximum sampling rate of over 500 Mega-samples-per-second and can capture up to 40 million samples per second with its interleaved memory architecture. Its high-resolution display allows for clear display of waveforms, even with long acquisition times. In addition, TEKTRONIX TDS3052 has a color grade mode which allows for simultaneous display of both analog and digital input data. TDS3052's analysis capabilities include advanced trigger and math functions such as FFT, real-time histogram, waveform math, power analysis, and archiving capabilities. It has 16-bit resolution with a low noise floor and high accuracy timing and frequency measurements. It also has MATLAB support which is ideal for sophisticated signal and system simulations. For testing and debugging, TEKTRONIX TDS3052 offers both history and A/B waveform switching, waveform search and marker functions. It also allows for multi-channel CPU debug, asynchronous communications, and signal integrity analysis. In terms of safety, TDS3052 has an Over-Voltage Protection (OVP) system which automatically shuts down power if any of the input signals exceed their rated value. It also has an ESD protect system that prevents electrostatic discharge from damaging the circuitry. Overall, TEKTRONIX TDS3052 is a highly advanced electronic test and measurement equipment which offers users a wide range of features and capabilities. Its robust design ensures precision measurements and reliable results, making it an ideal choice for all types of electronic testing and debugging applications.