Used TEKTRONIX TDS540C #9004334 for sale
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ID: 9004334
Oscilloscope
500 MHz
(4) Channels
2 GS/s
Options:
13: RS-232
1F: 3.5" floppy drive.
TEKTRONIX TDS540C is a 4-channel, 500MHz Waveform digitizer instrument from TEKTRONIX, an industry-leading provider of instrumentation and test equipment. With a maximum sample rate of 2 GS/sec, TDS540C provides a comprehensive, high-bandwidth solution for precise measurements and low-jitter characterization of modern communication signals. It has standard features such as four isolated 400MHz AC-coupled inputs, 500MHz real-time sample rate, 32 M sample memory depth, 1 mV/div to 20 V/div vertical amplitude range, 2 ns/div to 20 s/div timebase range, 10 bit vertical resolution, and up to 20,000 wfms/s waveform capture rate. The instruments also support multiple waveforms, triggering of multiple events, built-in mathematical, and advanced triggering functions. Furthermore, TEKTRONIX TDS540C is integrated with a built-in oscilloscope/ waveform digitizer/ recording/analysis/playback that allows users to easily capture real-time waveforms and review the data later using TEKTRONIX software such as Waveform Explorer. Its intuitive and simple user interface also makes it easier to visualize and analyze waveforms, as well as to select, set trigger, and capture waveforms quickly and easily. This eliminates the need for additional instrumentation and data acquisitions systems, cost, and time required for such analyses and measurements. TDS540C also includes an advance waveform trigger available option that enables users to trigger off of complex events such as low-to-high, high-to-low, pulse width, runt, and threshold levels. This high performance trigger system provides high trigger sensitivity and longer hold-off times for users to capture events of interest. TEKTRONIX TDS540C is a versatile instrument suitable for a variety of performance testing and verification applications such as digital communication system characterization, high-bandwidth waveform capture, serial data link analysis, and semiconductor device characterization. The instrument's high performance, along with its robust trigger system and excellent waveform capture rate, makes it an ideal solution for these demanding test requirements.
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