Used TEKTRONIX TLA 7Q4 #9286234 for sale

TEKTRONIX TLA 7Q4 is an electronic test equipment designed to provide digital protocol compliance testing at higher data rates for designers and manufacturing organizations. Its functions help verify the performance of embedded designs, optical and board electrical connectivity of high-speed digital interfaces with low added cost. TLA 7Q4 offers a 1GHz 8bit data capture rate and 64M Record Length with full memory depth and persistence that provide flexible testing and analysis of high data rates. Supported triggers and a wide range of advanced features help users isolate and identify protocol-level errors, and monitor and capture small signal changes during data transitions and sustain data-dependent jitter measurements. TEKTRONIX TLA 7Q4 is user-friendly and easy to use, with intuitive windows-style menu meeting the testing challenges from embdded designs to optical and board electrical testing with exemplary performance. It is equipped with a number of features including a user-friendly Windows-style menu, hardware-based and software-based triggering, equipment-wide clock domain auto-spanning, real-time masking, system-wide auto-spanning of data and annotation markers. TLA 7Q4 is also equipped with WaveView™ Measurement Composer, an innovative toolset that can create hierarchical complex measurements with repeatable execution sequences. Data acquisition is performed in 16-bit resolution for greater data capture depth, coupled with color-coded electrical and optical tests of the signal integrity. This instrument also has the ability to create an automated test program launch from a Windows-based operating unit with an included ActiveX control. TEKTRONIX TLA 7Q4 can also perform signal integrity measurements based on compliance standards such as IEEE-414 and IEC 61076-3-104. This instrument offers additional vector information such as TX loss per port, OMA per port, and ISI per port where the optical transmitter symbol rate is greater than 6 Gbps. In conclusion, TLA 7Q4 is an ultra-high efficiency digital protocol compliance test equipment that enables users to verify and debug digital designs in real-time. It helps ensure compliance with standards such as IEEE-414 and IEC 61076-3-104 for higher data rates. Its flexible test and analysis capabilities allow to isolate and identify protocol-level errors and monitor small signal changes. It also offers advanced features including WaveView Measurement Composer, that helps create hierarchical complex measurements with repeatable execution sequences and automated test program launch from Windows-based operating machine.