Used TEL / TOKYO ELECTRON TEB407 #293660519 for sale

TEL / TOKYO ELECTRON TEB407 is an electronic test equipment designed to facilitate the measurement and characterization of semiconductor devices. TEL TEB407 test equipment provides engineers with a wide range of capabilities for testing and characterization of integrated circuits, analog components, and other types of semiconductors. TOKYO ELECTRON TEB407 offers users a low current and high voltage testing capability of 0.100mA up to 40V, with the ability to measure both DC and AC measurements. The machine also provides precise resolution for both current and voltage measurements via its high sampling rate, up to 20kHz. Further, TEB407 boasts a high frequency response of up to 150kHz, allowing users to capture high-speed transistor characteristics for analysis as well as for stable source measurement. TEL / TOKYO ELECTRON TEB407 is compatible with a range of testing modules, such as CPU, logic and memory testers, allowing users to test more complex systems with multiple input and output functions. It is equipped with a built-in EPSON-made graphical display module, allowing users to observe real-time displays of measurements. The system is supported by several software options, such as an FLP Calculator, which enables users to accurately calculate semiconductor parameters as well as an analyzer with a wide range of evaluation functions. TEL TEB407 is a reliable and compact test unit which offers a range of testing and characterization capabilities to meet the requirements of semiconductor device manufacturers. It can be used in laboratory, production line and in-machine testing applications, providing higher efficiency and reliability for component measurements. The machine's flexibility allows users to develop tailored test programs, creating accurate and repeatable test analysis with minimal effort. This makes TOKYO ELECTRON TEB407 a convenient and cost-effective option for technicians and engineers looking to characterize and analyze semiconductor devices.