Used YOKOGAWA OR 300E #9198606 for sale

YOKOGAWA OR 300E is an advanced electronic test equipment designed for comprehensive analysis of semiconductor device characteristics. It is equipped with sophisticated tools that can measure low frequency electrical properties such as Resistance, Capacitance, Leakage Current, and DC Voltage, as well as high frequency electrical properties such as Transcapacitance, C-V slope, and Maximum Oscillation Frequency (MOF). The device helps to understand the device under test (DUT) and to investigate the influence of fabrication parameters on its performance. OR 300E is the ideal choice for engineers who require reliable and accurate electrical testing with broad frequency coverage. It provides a wide range of measurement functions and includes a user-friendly software package for data handling and analysis. An integrated touchscreen monitor provides a clear view of the test setup and results. YOKOGAWA OR 300E can be easily integrated with other laboratory instruments for more detailed and complex measurements. This innovative device has a fully-featured data handling and analysis software, providing an array of data processing possibilities, such as linear fitting, equivalent circuit simulation, and curve tracing. The software can also be used to measure dielectric properties of a variety of materials under investigation. OR 300E features YOKOGAWA advanced designed Digital Lockin Detector, which is capable of detecting small signals from a wide dynamic range and giving reliable and repeatable results with each measurement. The device also includes an optional heater system, making it capable of performing tests over an extended temperature range. YOKOGAWA OR 300E has an integrated ultra wide dynamic range of 64 or 128-channel direct current (DC) bias Tester. This flexible instrument measures the gate characteristics of semiconductor devices, making it ideal for various application-specific tasks. The Tester also supports automated test routines with a unique 'Auto Test' feature incorporated into the software. To summarize, OR 300E is a powerful and versatile tool that enables comprehensive characterization of semiconductor devices. The device provides reliable and repeatable measurements over a wide dynamic range and accommodates a variety of test applications. With its comprehensive suite of software, YOKOGAWA OR 300E is the perfect choice for any laboratory.