Used ELLIPSOTECH Elli-633-F70 #9249918 for sale

ELLIPSOTECH Elli-633-F70 Ellipsometer is a space-saving and high-performance instrument for measuring optical properties and optical thicknesses of thin films. This ellipsometer is universally applicable for monitoring a wide range of thin films such as oxides, nitrides, metals and metal alloys, with sample thicknesses ranging from 0.3nm to 4000nm. The Ellipsometer's innovative design features a highly precise and accurate laser and sample scanning system coupled with an intuitive user interface with an easy-to-use, window-based environment. This system allows the user to quickly and accurately measure a wide range of thin film properties over large sample areas. The Ellipsometer is capable of measuring a number of properties including optical thickness, refractive index, extinction coefficient, optical constants, emission spectrum, absorbance, angle of incidence, film type, thickness uniformity, refractive uniformity, waveguide lifetime, layer spacings, and more. These measurements can be taken with absolute confidence due to the system's repeatability and reproducibility. The Ellipsometer utilizes a polarized laser beam to measure thin film optical properties. The incident beam is generated by a Nd:YAG laser source with a wavelength of 633 nm and is comprised of both s- and p-polarized light. The incident angle of the light is adjustable with an angle sensitivity of 10-5 radians, enabling the user to accurately measure the optical properties of thin films. The Ellipsometer uses a computer-controlled sample translation stage and sample position detector to ensure accurate sample positioning and optimal angle of incidence. This allows the instrument to precisely measure the optical properties of thin films with superior accuracy and repeatability, enabling the users to accurately assess optical properties over timescales of hours, days or even months depending on the objectives. The Ellipsometer can also be remotely operated using a networked PC with access to professional software. This allows users to access the instrument and perform its measurements from anywhere in the world, making it extremely easy and convenient to perform both simple and complex optical measurements. The Ellipsometer is simple to operate and offers powerful performance for the measurement of thin film properties. It is designed with industry-leading durability and robustness to ensure accurate and reliable measurements over long periods of time. The real-time graphical display of the optical properties makes this instrument easy to use and helps the users to quickly identify the optimum optical parameters for their measurements.