Used ELLIPSOTECH Elli-SE-F #9117366 for sale

ELLIPSOTECH Elli-SE-F Ellipsometer is an excellent tool for thin film characterization and quality control. It allows non-destructive, rapid and accurate measurements of film thickness, composition and optical constants. The Ellipsometer provides instant results of reflection of both s- and p- polarized light from any type of surface, including both planar and circular surfaces. Equipped with an automated optical equipment, it offers a fast, accurate and reliable analysis of all film layers, with a sample area of up to 25 mm diameter. Elli-SE-F utilizes a four axes air-bearing Y-Z-WA-WP optical system, which is able to accurately line up the incident light onto the sample surface, as well as capture the reflected light from the sample through a CCD camera. This unit is coupled with a precision stepper motor for angular movement, ensuring accurate light modulation and thus precise measurement. The motor is capable of angular movement up to 0.0001°, which enables high precision of the measurement results. The Ellipsometer also incorporates an innovative angular scan range selection machine, including an independent circle scan option, to individually adjust angular range settings by layer and select the most optimum measurement model. This range selection tool allows for the most suitable scan cycle for each individual sample. With a measurement area of up to 25 mm, ELLIPSOTECH Elli-SE-F is able to measure a wider range of samples compared to other ellipsometers. Apart from that, its adjustable air-bearing asset provides automated positioning of the sample for each ripple measurement. The sample holder is also designed in an ergonomic structure, delivering highly repeatable measurements with a minimum of effort. The Ellipsometer also features an integrated software, which displays the acquired data either on its graphical user interface (GUI) screen or in tabulated form. This facilitates the characterization of the sample, with all parameters and results being clearly displayed for easy analysis. Overall, Elli-SE-F Ellipsometer is an efficient tool for measuring thin film layers, providing rapid and reliable results with high accuracy. Its automated optical model is coupled with an ergonomic sample holder and angular scan range selection equipment, thus enabling more precise measurements of any type of sample with ease.