Used ELLIPSOTECH Elli-SE-F #9249919 for sale

An ELLIPSOTECH Elli-SE-F is an advanced, state-of-the-art ellipsometer designed for precise and accurate measurements of surface properties in research and industrial settings. It utilizes aEllipsometric Phase Analysis (EPA) method to determine the thickness, composition, and other important attributes of thin films. The instrument comprises of a single arm configuration, a laser light source, a monochromator, polarizer, an angled mirror, and a detector that measures the phase shift of the incident light. Elli-SE-F provides a number of unique features which make it an ideal solution for a wide range of applications such as spectroscopy, film deposition monitoring, validation of optical characteristics, and other nanotechnology research. These features include its high accuracy and resolution, a powerful software package for automated and comprehensive data analysis, a wide dynamic range, and multi-wavelength operation. The instrument is equipped with the EllipsoMax software suite which enables analysis of process parameters from different deposition steps. It also allows for the comparison of results between different samples, and the ability to collect and store data in the form of graphs and tables. This software is designed to be user-friendly, allowing even users with no scientific background to become quickly acquainted with its operation. In addition to its main features, ELLIPSOTECH Elli-SE-F also offers automated calibration and maintenance to ensure the maximum precision of results. Its calibration mode ensures that the instrument maintains its accuracy over a prolonged period of time. The instrument is also equipped with temperature and humidity sensors which help to protect the sensitive components from environmental influences. Furthermore, the instrument has a built-in sample tilt and sample rotation device to provide a more comprehensive analysis. Elli-SE-F is an unbeatable and reliable device, suitable for applications in research and industrial use. It offers a cost-effective solution for the calibration and maintenance of thin films and nanoscale components. The instrument provides the highest accuracy, the widest wavelength range, and advanced software that helps to streamline the process of data analysis. It is a top-of-the-line device, and is the perfect solution for the research and development of advanced nanotechnology.