Used GAERTNER L106C #116155 for sale

Name: GAERTNER L106C
Brand: GAERTNER
SKU: 116155
Availability: InStock

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Ellipsometers

Manufacturer

GAERTNER

Model

L106C

ID: 116155

Wafer Size: 6"

Large substrate ellipsometer Manual load Stage: 15" diameter circle, rotates 360° Radial sliding scale: Graduated in 0.1 cm increments Total stage travel: 19.8 cm Variable angle model Used for measuring coatings on 14" diameter glass disks Alignment: Built-in axis of rotation of incident arms is in the sample plane Method of measurement: Rotating analyzer samples (144) data points Detector: Solid state with auto gain feature Incidence angle: 30°, 45°, 50°, 55°. 60°, 65°. 70°, 75°, 80°, 90° Light source: HeNe 6328A Laser gives less than 1 mW output on sample Beam diameter (Standard): 1 mm diameter (1 X 3mm on wafer @ 70°) Measurement time: 3 Seconds Sample monitor: (39) Power microscopes for surface viewing Tilt monitor for checking sample out of flatness Sample (wafer) size: 6" Diameter standard 3" Linear 360° Rotary motion covers any point on a 6" diameter wafer Interface: RS232 Computer: IBM PS/2-25 Model 8525001 Film thickness range: 0-60,000 Angstroms Accuracy: ±3 Angstroms Repeatability: ±3 Angstrom Refractive index: ± .005 Power: 115V, 100V, 220V, 230V, 240V.

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GAERTNER L106C is a state of the art, contactless ellipsometer designed to measure the complex optical properties of thin films and surfaces. This device is capable of determining both the film's thickness and its optical constants with a combination of exceptional speed, accuracy and repeatability. L106C features a compact design and provides the user with a variety of options for data logging and data analysis. With its advanced optical design, GAERTNER L106C is capable of measuring a broad spectrum of samples such as transparent, semi-transparent, transparent-opaque and diffuse surfaces. The equipment uses a polarization-modulated laser diode as the light source and incorporates a unique, dual anamorphic prism design to achieve greater accuracy of the measurement. The ellipsometer is capable of obtaining precise measurements of critical film parameters, including the thickness, optical constants and refractive indices. The system can scan multiple angles of incidence simultaneously, allowing the user to quickly analyze the complex optical properties of their sample. L106C also includes a comprehensive software package that helps the user to store and analyze their measurement data. The software can be customized to best suit the user's needs, with options to save various combinations of film parameters and to generate reports based on the data collected. The unit also features a motorized sample stage for convenient, fast and precise sample positioning. This allows the user to quickly and accurately test a wide variety of samples, ensuring that the measurements are obtained under consistent, repeatable conditions. In addition, the machine is designed to operate, even in illuminated environments, with no additional light source required. GAERTNER L106C is a powerful, versatile tool for performing precise and reliable measurements on thin films and optical surfaces. Its combination of advanced design and user-friendly software ensures accurate, repeatable results without sacrificing speed or cost. This device is ideal for a variety of applications such as semiconductor, optoelectronic and display technologies.