Used GAERTNER L115 A #9166572 for sale

GAERTNER L115 A is an advanced laser-based ellipsometer, designed for non-destructive measurements of thin films and multilayer stacks. It utilizes a laser to generate an interference pattern, which is then measured to determine the optical properties of a sample. L115 A is an advanced tool for optical metrology, used to analyze the thickness, optical constants, and other properties of thin film layers. The instrument is equipped with a HeNe laser light source, with a wavelength of 632.8 nm and a power of approximately 2.5 mW. The laser is focused onto the sample by a focusing mirror and a beam splitter/polarizing prism. The incident light is then reflected off the sample and deviated by a reflection angle meter. The data is collected using a highly sensitive CCD detector and then analyzed using proprietary software. This provides the user with precise measurements of the sample's optical constants, thickness, and other optical properties. GAERTNER L115 A also offers several advanced features, such as variable incident light intensities, 4-stage fine-tuning of the incident angle, and precise point scanning. Additionally, the software allows the user to analyze the data in a variety of ways, including plotting curves and histograms. The software also allows the user to use standard measurement protocols, such as the Tauc-Lorentz equation, to accurately measure the optical properties of samples. L115 A is a reliable and precise tool for optical metrology. Its robust, user-friendly software provides an easy-to-use interface, along with comprehensive data analysis capabilities. Additionally, the instrument's reliable laser-driven technology allows for non-destructive measurements of thin film layers, without compromising accuracy. This makes GAERTNER L115 A the ideal solution for thin film analysis.