Used GAERTNER L115 A #938 for sale

GAERTNER L115 A is an automated multi-angle spectroscopic ellipsometer that can measure the optical material properties of a wide variety of materials in a repeatable manner. The equipment enables powerful, rapid and highly accurate characterization of thin-film layers up to 2 microns in thickness, ranging from non-magnetic semiconductors to transparent materials, dielectric and organic layers, magnetic materials, and other metallic thin-film structures. It has the ability to quickly measure optical properties of various materials with up to four spectroscopic angles at a time, allowing users to have access to more information and to better understand the surface structure of their sample. L115 A uses automated sample placement, positioning, and characterisation, making the process faster, simpler, and repeatable. The ellipsometer has a combination of automatic wavelengths selection and always-accurate laser scanning angles, resulting in unprecedented accuracy and repeatability. In addition, it has a closed-loop homodyne detection system that ensures further accuracy as well as fast data acquisition and interpretation. The analysis data acquisition software package was specifically designed to enable users to collect data quickly. It also provides fast and easy access to results to enable an integrated evaluation of the ellipsometry results with other characterization techniques within the measurement unit. This software is easily upgradeable and allows users to include additional features to increase knowledge of their sample's surface structures. In addition to tailored metrology capabilities, GAERTNER L115 A also includes additional features such as a motorized x-y-z positioning stage, a sample changer, an automatically-aligned microscope, an automatic sample navigation machine, an atmospheric-pressure area detector, and a contamination monitor. The wide range of operational accessories of L115 A, from automatic sample placement, to the user-friendly data acquisition software, make the ellipsometer an ideal tool for for thin-film characterization and the analysis of material properties in demanding environments.