Used GAERTNER L115 #131671 for sale

GAERTNER L115 is a specialised optical instrument used to measure the optical properties of thin films and nano-structures. It is typically used in the fields of semiconductor fabrication, materials science, nano-structures and optical coatings. This ellipsometer takes advantage of polarised light to determine the optical properties of a sample. The instrument features a modular, flexibly automated and easy to use platform. It is equipped with a fiber-optic, 45°-tilting- ellipsometer with a wide angular range of 30-160° to measure the optical properties of the sample. Along with the ellipsometer, the system is also equipped with an automated sample manipulation system, providing mobility and allowing automatic exchange of samples from different containers. Other technological components of the system include a powerful motorised microscope objective for sample inspection and pumping systems for dry and wet cleaning. The instrument is able to measure a wide range of optical properties including birefringence, optical anisotropy, thickness, refractive index and absorption coefficient of the sample. The ability of the ellipsometer to measure these properties allows for a comprehensive characterization of thin films, layers, and nano-structures. Using an advanced software platform, the instrument offers automation of the entire measurement procedure. This allows users to conduct their measurements quickly and easily. Furthermore, the software provides a database of measured samples, providing data management and analysis. The software also features a graphical user interface (GUI) and can export data in various formats. L115 is the perfect tool for a variety of scientific applications. Its automated platform and versatile software enable researchers to accurately and quickly measure the optical properties of thin films, layers, and nano-structures. Its ease of use, flexibility and comprehensive data analysis capabilities make it an ideal instrument for numerous research areas.