Used GAERTNER L115 #9144443 for sale

GAERTNER L115 is a research-grade optical ellipsometer designed specifically for modern materials research. It measures the change in polarization state of light as the light reflects from surfaces, and is used to determine information about the optical and surface properties of thin film materials. L115 uses an optical head that consists of two polarization-analyzing filters and a "polarizer-analyzer" assembly that is computer-controlled. This makes GAERTNER L115 capable of accurately measure changes in the polarization state of light as it interacts with a sample. This allows the ellipsometer to measure the reflective and transmissive properties of materials at angles angles ranging from 8-85°. The system is also capable of measuring samples in various environments, including ambient air, vacuum, and gas. L115 features an automated system that can take multiple samples in quick succession. The system can measure samples as thin as 0.8nm or as thick as 8mm. In addition, the instrument is equipped with a back-thin sample holder, designed to keep samples flat during measurement. GAERTNER L115 utilizes a variety of software packages for data analysis, including DataFinder, EXcalibrator, and XSpectra. DataFinder is capable of processing and displaying real-time and historic data from L115, while EXcalibrator helps with sample preparation and provides functions for measuring reflectance and transmittance. XSpectra is a fully featured software package that allows users to model complex materials films and perform optical diagnostics. GAERTNER L115 is a powerful and versatile ellipsometer that is built for quality, accuracy, and repeatability. It offers precise and reliable measurements for a broad range of materials, and is an ideal choice for researchers in the fields of surface science, optical transition metals, semiconductors, optics, and thin film material analysis.