Used GAERTNER L115 #9176770 for sale

GAERTNER L115 is an advanced ellipsometer developed by GAE International, one of the world's leading manufacturers of ellipsometers for a wide range of applications. L115 offers comprehensive measurements of optical properties of thin films in the visible and near-infrared wavelengths. This state-of-the-art ellipsometer is equipped with a large sample holder that can hold up to four independent sample assemblies and provides a variety of measurement modes including high-accuracy single wavelength, dual wavelength, and multi-wavelength Rapid-Scan Ellipsometry (RSE) measurements. It is also capable of acquiring single and multiple angle-of-incidence, multiple wavelength ellipsometry data that is typically used for characterizing film thickness and optical constants. The advanced optical design of the system permits accurate characterization of both linear and non-linear films such as absorbing or non-absorbing films. Its integrated software platform provides users with a variety of analytical tools such as film thickness measurements, optical constant estimation, optical characterization of non-linear films, and spectral reflectance analysis without having to support any other software. GAERTNER L115 is designed to provide accurate and repeatable ellipsometry data with minimal operator interference. It features repeated wave length scanning for measuring film thickness, rotationally symmetric structures and thin films with low optical constants. It also includes an integrated 4D calorimetry device for measurements of physical thickness and total optical thickness of pixel-level thin film samples. Integrated automation tools, such as measurement planning, and scan scheduling can drastically reduce the time associated with acquisition of ellipsometry data, significantly increasing instrument efficiency and throughput. With its enhanced data security features, encrypted tuning and reserved memory, even the most sensitive data can be used without an issue. L115 can easily handle a range of sample types of both linear and non-linear thin film samples, making it a perfect choice for academic labs, research facilities, industrial and production applications. Its enlarged sample size and multiple sample holders make measurements faster than ever before, while its optimized optical design minimizes the measurement time, allowing for more accurate and reliable results. GAERTNER L115 is built with cutting-edge technology, allowing for comprehensive characterization of a wide range of optical and surface properties. With its advanced features, intuitive software system, and leading-edge optical technology this ellipsometer has become an essential tool for many research and industrial applications.