Used GAERTNER L115A #9187712 for sale

GAERTNER L115A is an ellipsometer from the range of high-end analytical instruments manufactured by the company GAERTNER. It is dedicated to the analysis of thin film layers or surfaces, making it highly suitable for research and development applications in a wide range of industries, from semiconductor fabrication processes to nanotechnology research. L115A is capable of analyzing down to 500 Angstroms (5 × 10^-7m) with the highest accuracy of any ellipsometer available. This makes it suitable for analysis of all types of layers, including transparent layers. It also features a wide range of wavelengths (from 250 nm to 1650 nm) for maximum resolution and an auto calibration option for ease of use. The device comes pre-programmed with two main modes of operation, "Research" and "Routine". Research mode allows for a wide range of sample measurements and setups to be quickly and efficiently implemented and measured, saving both time and effort. Routine mode is more tailored towards longer runs and automation, allowing for high throughput and consistency. In addition to the popular ellipsometry measurements, GAERTNER L115A is also capable of determining a variety of other properties, including optical constants, effective optical properties, refractive index, extinction coefficient, and macroscopic optical properties. This provides users with an even greater level of insight into their samples. The system also features computer interfacing through USB, Ethernet, RS232, and GPIB protocols, allowing it to be easily integrated with other instruments or software, if desired. This allows for greater flexibility and efficiency when dealing with larger datasets. As a top-end ellipsometer, L115A is an ideal choice for researchers and manufacturers dealing with thin films and surfaces. Its high accuracy and resolution, combined with its array of automated features and software, makes it a powerful and reliable tool for any application.