Used GAERTNER L115B #9272576 for sale

GAERTNER L115B Ellipsometer is an advanced optical measurement system designed for accurate characterizations of thin films and optical materials. Ellipsometers are used to measure properties such as thickness, index of refraction, absorption, and surface and interface roughness. L115B is a spectroscopic ellipsometer which uses an unpolarized light source, a monochromator, and 2 field-of-view detectors. The two vertical and horizontal angles created by the light source and detectors measure the ellipticity and phase shift of the reflected light, providing a wealth of information about the optical properties of a sample. The device supports multiple optional accessories, such as a variety of sample holders, an automated sample high temperature stage, a computer controlled motorized focus, and an automatic arc lamp. GAERTNER L115B is capable of measuring optical properties over a wide range of angles from angles from 25° to 85°. This allows for accurate characterization of very thin films, as well as more complex materials, including layered and multilayered films. It also offers a high resolution and wide dynamic range, allowing for precise characterization of optical properties. The software that runs L115B features a wide range of analyses and reporting capabilities. GAERTNER L115B is a powerful tool for gathering a wide range of film and optical material information, as well as for performing automated film characterization. It is an ideal choice for evaluating device production yields, troubleshooting problems, or performing in-depth studies of materials. The device is designed to be highly reliable and easy to use, with clearly labeled buttons and parameters, as well as an on-board video display. Overall, L115B Ellipsometer is an accurate optical measurement system designed to provide detailed information about thin films and other optical materials. Its wide range of angles, high resolution, and customizable software make it an ideal tool for applications such as thin film characterization and automated film evaluation.