Used GAERTNER L115C-8 #293663061 for sale

GAERTNER L115C-8 is an ellipsometer, a precision instrument used for analyzing thin-film surfaces. This particular ellipsometer model was manufactured by GAERTNER Scientific Corporation, which specialized in scientific instrumentation for research and development. It uses mathematical analyses to determine optical parameters on thin-film surfaces. This includes parameters such as refractive indices, film thickness, optical constants, and surface roughness. L115C-8 is a fully-integrated, benchtop instrument that is both flexible and powerful. It consists of a closed integrated system with optical components, a controller, and a software interface. The system includes an optical head with a variable polarizer, an incident light source, and a sample mount. It also includes a power supply and a variable-angle detector unit. The advanced controller includes four motorized axes, two of which are used for sample rotation. The software interface is used to control the instruments and analyze results. GAERTNER L115C-8 is capable of measuring a wide range of films, from the ultra-thin to the highly reflective. It features a wide dynamic range and more precise calibration, and offers superior optical performance. Its series of variable angle measurements allow for both polar and non-polar samples, the capability of taking multiple measurements simultaneously, and fast and accurate measurements. An additional feature of this instrument is its use of differential sum and differential difference measurements. This allows the user to make qualitative and quantitative analyses of the surface's optical properties. L115C-8 ellipsometer is a highly reliable and precise instrument, capable of giving accurate and repeatable results. It is used extensively in the semiconductor and optical industries, as well as research laboratories, to characterize thin-film surfaces of materials. Its efficiency and flexibility make it a useful and valuable tool for a variety of applications.