Used GAERTNER L115C-8 #9400516 for sale

GAERTNER L115C-8 Ellipsometer is a highly advanced tool used for precise and non-invasive surface measurements. It is a spectroscopic tool that measures the change in polarization of a monochromatic light after being reflected off the surface of a sample. This change in polarization, or ellipticity, is a reliable way to measure very small changes in thickness and refractive index of materials. L115C-8 Ellipsometer has a unique design with a large diameter air-bearing sample stage, allowing the user to rotate the sample through 360° without manual intervention. It also comes equipped with an automatic XY translation stage that allows measurement of multiple samples without repositioning. This translation stage is also designed to support large sample substrates up to 200mm square in size. GAERTNER L115C-8 Ellipsometer has a high optical throughput, allowing it to measure samples with maximum contrast and sharpness. It is also capable of measuring a wide range of wavelengths from the visible to the near-infrared. Additionally, its integrated photon sensor array is designed to deliver highly accurate data with improved contrast and signal-to-noise ratio. In terms of measurement accuracy, L115C-8 is designed to facilitate measurement of samples with nanometer-scale accuracy. It also comes with a multitude of software packages, such as cross-sectional imaging software, that can be used to analyze and visualize acquired data. GAERTNER L115C-8 Ellipsometer may be used in a variety of research, development, and commercial applications, such as the analysis of ultra-thin films, nanostructures, advanced materials and their structures, photovoltaic cells, and semiconductor devices. It can also be used in advanced engineering applications, such as optical metrology, and wafer-level reliability testing. Furthermore, the ability to measure the thickness and refractive index of small samples with nanometer-level accuracy makes L115C-8 particularly suitable for the characterization of optical coatings and other optically-sensitive materials. GAERTNER L115C-8 Ellipsometer is a versatile and precise tool designed for use in surface measurements. Its large sample stage, integrated photon sensor array, and range of software packages enable it to accurately measure nanometer-scale samples with high accuracy and contrast. Its variety of applications in research, development, and product testing make it a useful tool for a range of industries.