Used GAERTNER L115C #9196917 for sale

GAERTNER L115C
Manufacturer
GAERTNER
Model
L115C
ID: 9196917
Ellipsometer.
GAERTNER L115C is a state-of-the-art optical ellipsometer designed to measure a wide range of optical properties, including thickness, refractive index, and film stress of thin films. It is equipped with a monochromator light source, an extensive range of detectors and polarizers, and a precision optical mount with two manual axes. Combined with its intuitive user-friendly operation, GAERTNER L115 C is ideal for the characterization of thin films and other semiconductor materials. The monochromator offers a wide spectral range from 190nm - 1600nm, allowing the measurement of samples with properties varying widely throughout the spectrum. The high resolution of the system ensures accurate measurements, even at very low angles and angles greater than 70 degrees. The detectors and polarizers coupled with the monochromator allow for measurements across a wide range of angles and polarizations. This flexibility helps to reduce measurement time and ensure accuracy in all measurements. The precision optical mounts provide two manual axes that allow the instruments to be configured for different sample angles and angles of incidence. The angles can also be adjusted on the fly to acquire data over a wide range of angles as needed. The high stability of the mount ensures accurate measurements and reduces any drift that would otherwise be found in a manual system. L 115 C also offers a variety of options for data analysis and reporting. It is capable of computing and displaying the ellipsometric parameters of a sample as well as providing information regarding thickness, refractive index, and film stress. It also includes software for more advanced analysis such as fitting parameters. GAERTNER L 115 C is an advanced ellipsometer designed for both lab and production level studies. Its intuitive user-friendly operation, wide range of data collection capabilities, as well as easy to use data analysis and reporting features, makes it one of the most advanced thin film characterization instruments available. With its ability to quickly, easily and accurately measure a variety of optical properties, L115 C is a must-have for any materials research laboratory.
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