Used GAERTNER L115S #9276525 for sale

GAERTNER L115S Automatic Ellipsometer accurately measures the properties of thin films and substrates through a wide wavelength range. It is a compact, light-weight, and easy-to-use instrument, allowing accurate angle-resolved measurements for both reflection and transmission over the near-infrared region. It features a state-of-the-art detection system for precise data collection, a motorized sample stage, an integrated polarizer, and advanced software that allows sample positioning and alignment. The detector for L115S is a silicon detector array coupled with physical collimators that enable angle-iesolved measurements with supreme accuracy. The detector head is designed to give outstanding performance over a wide wavelength range. The software lets users easily control the wave-length accurately, so that measurements can be taken over different regions to ensure accurate characterization. The motorized sample stage ensures precise sample positioning for analysis. Additionally, the sample tray permits convenient placement of multiple samples. The optics on GAERTNER L115S are designed for wide-spectrum angle-resolved measurements. It features a top-mounted polarizer and an IR filter, which helps analyze dynamic behavior in film structure. The automated motorized sample stage enables user to quickly adjust the sample angle with respect to the light source, making it ideal for research grade thin film characterization. L115S offers a range of advanced software features. It provides an intuitive graphical user interface that enables users to easily navigate and analyze the data collected from samples. Additionally, the integrated polarization system allows users to measure local film properties through spectroscopic ellipsometry. The software is able to store multiple angles, power, and phase data on a variety of sample types. It also features an angle- or wavelength-dependent film thickness generator for studying layer stacks. Overall, GAERTNER L115S is an extremely accurate and powerful ellipsometer suitable for research grade thin film characterization. Its sophisticated detector, optics, and software features allow users to acquire precise data on samples with an excellent signal-to-noise ratio. The instrument is ideal for material science and optoelectronic applications.