Used GAERTNER L116 A #54691 for sale

GAERTNER L116 A is an ellipsometer designed to measure properties of thin films including complex index of refraction, layer thickness, and optical constants. This type of instrument is critical for many applications, from research and development to production line control. The instrument uses a polarized light source, which can be varied in P- and S- polarization, to measure thin film properties. The polarized light interacts with the thin film, then is reclaimed via a lens system and split into two beams in the polar and azimuthal planes. The ellipsometer then makes a 2nd order analysis of the reflected beams to determine properties such as complex index of refraction, layer thickness, and optical constants. L116 A is robust and reliable, extremely accurate, and very reliable. This makes it a perfect choice for industrial applications. It has a wide spectral range of 250 to 2000 nm with resolution of 0.1 nm. This allows the accurate measurement of thin films with the great precision of the instrument. The instrument has a high repeatability of 1% with a repeatable accuracy of 0.5% and robust precision of 0.1%. The instrument has an integrated sampling system, allowing it to be used in production line applications. In addition, the high signal to noise ratio ensures accurate measurements are taken quickly and efficiently. The intuitive graphical user interface makes the instrument easy to operate, for both the novice and expert user. GAERTNER L116 A is a powerful and reliable ellipsometer, designed for thin film production and research applications. With its wide spectral range, high precision, and robust repeatability, it is an incredibly accurate tool for thin film measurements. The sophisticated graphical user interface makes it easy to use, allowing you to quickly and accurately measure thin film properties such as complex index of refraction, layer thickness, and optical constants.