Used GAERTNER L116 A #9211689 for sale

A GAERTNER L116 A (an ellipsometer) is a highly accurate tool used to characterize the properties of thin films and other layered materials. It measures the change in a light beam's polarization state, which is known as 'ellipsometry'. All forms of ellipsometry are centered on the determination of the ratio of film parameters such as refractive index and optical thickness (i.e. the product of refractive index and thickness). L116 A in particular is a unique and intricate piece of scientific equipment constructed for precise measurements. GAERTNER L116 A consists of three main components: a polarizer, a rotatable sample holder, and an analyzer. The first component generates a polarized beam of light, which is then directed towards the sample. The second component rotates the sample to a user-specified angle. Lastly, the analyzer measures the differences in the two polarization states before and after the light has been incident on the sample. By taking multiple measurements at various angles, the film parameters can be accurately determined. L116 A offers a wide range of adjustable parameters, which enable it to precisely measure thin films and other layered materials. These adjustable parameters include the angle of incidence, the optical power, the wavelength of the incident light, and the direction of polarization. Additionally, GAERTNER L116 A can be used to measure both surface and bulk properties of any given sample. L116 A also offers multiple analysis modes for various applications, including Thin Film, Multi-Layer, and Absorption Analysis. For Thin Film Analysis, the instrument measures and calculates the properties of a single layer sample. The Multi-Layer mode, on the other hand, is used to measure and calculate the properties (including thickness and refractive index) of multiple layers of any material. Lastly, the Absorption Analysis mode measures the spectral absorptance of substances, allowing researchers to gain insight into their optical properties. To further simplify operation, GAERTNER L116 A is equipped with intuitive and easy-to-use software. This software allows users to set up measurements quickly, perform analysis, and take corrective actions. It also has data transfer capability, allowing users to store and share their results with others. In summary, L116 A is a specialized instrument used for the analysis and characterization of thin films and other layered materials. Its complex features and adjustable parameters enable users to measure precise film parameters, and its intuitive software makes operation easier.