Used GAERTNER L116 B #5796 for sale

GAERTNER L116 B is an advanced-level ellipsometer designed for use in research laboratories, educational settings, and industrial production environments. It is a highly-accurate, user-friendly instrument, which can measure both thin-film and bulk sample properties. This ellipsometer is built with a long range of detection sensitivity, ranging from the UV to VL, and is capable of measuring sample properties of flakes, drops, and individual layers. The system utilizes a 650nm helium-neon laser, monochromator and optical polarizer/analyzer, combined with a sample holder, offset compensator and detector, to determine a sample's refractive index and thickness from the angle of light reflected off the surface of the sample. To ensure both high accuracy and precision results, the instrument is outfitted with a number of features, including a microprocessor-controlled stepper motor and IDL (Interactive Data Language) for manipulation of the signal, software for storing and retrieving measurement results, and auto-zeroing. Additionally, the sample holder is adjustable for both angle and distance, allowing for accurate and repeatable results. In order to measure thin film properties, L116 B has a spectroscopic detection range with spectral values in the range of 645-1060nm. This allows it to accurately measure refractive index and film thicknesses. Additionally, it is capable of providing bulk optical properties information on the sample by using the 830nm He-Ne laser and spectroscopic detection range. Overall, GAERTNER L116 B is a valuable tool in quality assurance and research-level investigations. Its accuracy and precision, combined with the capability to measure thin-film and bulk sample properties, make it a highly-effective and efficient asset for laboratories and industrial production environments.